AFM studies of polypyrrole film surface morphology I. The influence of film thickness and dopant nature

Synthetic Metals

Volumn 93, Issue 1, 1998, Pages 59-64

  Silk, Toomas ^a   Hong, Qi ^b   Tamm, Jüri ^a   Compton, Richard G ^b  

^a UNIVERSITY OF TARTU   (Estonia)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Atomic force microscopy; Dopant influence; Film thickness; Polypyrrole; Surface morphology

Indexed keywords

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); ELECTROPOLYMERIZATION; IONS; PLASTIC FILMS; SURFACE ROUGHNESS;

FILM THICKNESS;

CONDUCTIVE PLASTICS;

EID: 0031999843     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(98)80131-8     Document Type: Article

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