Spectrophotopolarimeter based on multiple reflections in a coated dielectric slab

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 53-57

  Azzam, R M A ^a,c   El Saba, A M ^b   Abushagur, M A G ^b  

^a UNO College of Engineering   (United States)

^b UNIVERSITY OF ALABAMA IN HUNTSVILLE   (United States)

^c The American University in Cairo   (Egypt)

Author keywords

Ellipsometry; Optical coatings; Polarimetry

Indexed keywords

DIELECTRIC MATERIALS; ELLIPSOMETRY; FUSED SILICA; LIGHT REFLECTION; OPTICAL COATINGS; PHOTODETECTORS; POLARIMETERS; REFLECTIVE COATINGS; THIN FILMS;

SPECTROPHOTOPOLARIMETERS; STOKES PARAMETERS;

SPECTROPHOTOMETERS;

EID: 0031999705     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00768-2     Document Type: Article

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