Visible and infrared optical constants of electrochromic materials for emissivity modulation applications

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 205-209

  Hale, Jeffrey S ^a   DeVries, Michael ^a   Dworak, Brad ^a   Woollam, John A ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

Electrochromism; Ellipsometry; Nickel oxide; Tungsten oxide

Indexed keywords

AMORPHOUS MATERIALS; COMPUTER SIMULATION; ELECTROCHROMISM; ELLIPSOMETRY; INFRARED RADIATION; LIGHT EMISSION; LIGHT MODULATION; NICKEL COMPOUNDS; POLYCRYSTALLINE MATERIALS; TUNGSTEN COMPOUNDS;

NICKEL OXIDE; OPTICAL CONSTANTS; TUNGSTEN OXIDE;

OPTICAL FILMS;

EID: 0031999551     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00818-3     Document Type: Article

References (6)

1. D.G. Gilmore, Satellite Thermal Control Handbook, Chap. 2, The Aerospace Corporation Press, El Segundo, CA, 1994.
2. D.G. Gilmore, Satellite Thermal Control Handbook, The Aerospace Corporation Press, El Segundo, CA, 1994, pp. 4-101.
3. C.G. Granqvist, Handbook of Inorganic Electrochromic Materials, Elsevier, Amsterdam, 1995.
4. R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam, 1977.
5. F. Wooten, Optical Properties of Solids, Chap. 3, Academic Press, San Diego, 1972.
6. S.F. Cogan, R.D. Rauh, J.D. Klein, T.D. Plante, Electrochromic devices for optical modulation in the infrared electrochromic materials II. Electrochem. Soc. Proc. 94-2 (1995) 269.