Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries

Optics Communications

Volumn 147, Issue 4-6, 1998, Pages 349-358

  Franta, Daniel ^a   Ohlídal, Ivan ^a  

^a MASARYK UNIVERSITY   (Czech Republic)

Author keywords

Near field optics; Rough thin films; Speckle effect

Indexed keywords

NUMERICAL ANALYSIS; OPTICAL CORRELATION; OPTICAL SYSTEMS; RANDOM PROCESSES; SPECKLE; THIN FILMS;

NEAR FIELD SPECKLE PATTERNS;

OPTICAL FILMS;

EID: 0031998252     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(97)00553-1     Document Type: Article

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