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Volumn 5, Issue 3-4, 1998, Pages 187-191

Characterisation of the optical properties of thin polymer films for their application in detection of volatile organic compounds

Author keywords

Interaction with volatile organic compounds; Polymer films; Sensors; Spectroscopic ellipsometry; Swelling of polymers

Indexed keywords

CHARACTERIZATION; ELLIPSOMETRY; OPTICAL PROPERTIES; REFRACTIVE INDEX; SENSORS; SPECTROSCOPIC ANALYSIS; THIN FILMS; TOLUENE; VOLATILE ORGANIC COMPOUNDS;

EID: 0031997216     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(97)00041-6     Document Type: Article
Times cited : (12)

References (7)
  • 6
    • 0041617868 scopus 로고
    • Thin films for optical systems
    • E. Toussacre, J. Zyss, Thin films for optical systems, SPIE 1782 (1992) 271.
    • (1992) SPIE , vol.1782 , pp. 271
    • Toussacre, E.1    Zyss, J.2
  • 7
    • 0041617867 scopus 로고
    • Bergmann Schaefer (Ed.), Optik, Walter de Gruyter, Berlin
    • H.-J. Eichler, in Bergmann Schaefer (Ed.), Lehrbuch der Experimentalphysik, Band 3, Optik, Walter de Gruyter, Berlin, 1993, p. 249.
    • (1993) Lehrbuch der Experimentalphysik , vol.3 , pp. 249
    • Eichler, H.-J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.