A mean field annealing approach to robust corner detection

IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics

Volumn 28, Issue 1, 1998, Pages 82-90

  Sohn, Kwanghoon ^a   Kim, Jung H ^b   Alexander, Winser E ^c  

^a Yonsei University   (South Korea)

^b NORTH CAROLINA A AND T STATE UNIVERSITY   (United States)

^c North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; IMAGE QUALITY; SIMULATED ANNEALING;

CORNER DETECTION; MEAN FIELD ANNEALING;

EDGE DETECTION;

EID: 0031996531     PISSN: 10834419     EISSN: None     Source Type: Journal    
DOI: 10.1109/3477.658581     Document Type: Article

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