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Volumn 8, Issue 2, 1998, Pages 90-92

Time-Domain Transmission Matrix of Lossy Transmission Lines

Author keywords

Characteristics; Transmission line; Transmission matrix

Indexed keywords

MATRIX ALGEBRA; TIME DOMAIN ANALYSIS;

EID: 0031996464     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.658651     Document Type: Article
Times cited : (2)

References (4)
  • 1
    • 0025111889 scopus 로고
    • Time domain simulation of uniform and nonuniform multiconductor lossy lines by the method of characteristics
    • May
    • N. Orhanovic, V. K. Tripathi, and P. Wang, "Time domain simulation of uniform and nonuniform multiconductor lossy lines by the method of characteristics," in Proc. MTT-S, May 1990, pp. 1191-1194.
    • (1990) Proc. MTT-S , pp. 1191-1194
    • Orhanovic, N.1    Tripathi, V.K.2    Wang, P.3
  • 2
    • 0031145667 scopus 로고    scopus 로고
    • Fast simulation and sensitivity analysis of lossy transmission lines by the method of characteristics
    • May
    • J.-F. Mao and E. S. Kuh, "Fast simulation and sensitivity analysis of lossy transmission lines by the method of characteristics," IEEE Trans. Circuits Syst. I, vol. 44, pp. 391-401, May 1997.
    • (1997) IEEE Trans. Circuits Syst. I , vol.44 , pp. 391-401
    • Mao, J.-F.1    Kuh, E.S.2
  • 3
    • 0030164939 scopus 로고    scopus 로고
    • Transmission line synthesis by the method of characteristics
    • June
    • J.-F. Mao, O. Wing, and F.-Y. Chang, "Transmission line synthesis by the method of characteristics," IEEE Trans. Circuit Syst. I, vol. 43, pp. 461-468, June 1996.
    • (1996) IEEE Trans. Circuit Syst. I , vol.43 , pp. 461-468
    • Mao, J.-F.1    Wing, O.2    Chang, F.-Y.3
  • 4
    • 0020113495 scopus 로고
    • Properties of interconnection on silicon, sapphire, and semiinsulating gallium arsenide substrates
    • Apr.
    • H. T. Youn, Y. Lin, and S. Y. Chiang, "Properties of interconnection on silicon, sapphire, and semiinsulating gallium arsenide substrates," IEEE Trans. Electron. Devices, p. 439, Apr. 1982.
    • (1982) IEEE Trans. Electron. Devices , pp. 439
    • Youn, H.T.1    Lin, Y.2    Chiang, S.Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.