A contribution to the analysis of the I-V characteristics of schottky structures

Solid-State Electronics

Volumn 42, Issue 2, 1998, Pages 235-241

  Donoval, Daniel ^a   Drobny, Vladimir ^a   Luza, Marek ^a  

^a SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; NUMERICAL ANALYSIS; SCHOTTKY BARRIER DIODES; THERMAL EFFECTS;

SCHOTTKY BARRIER HEIGHT; SCHOTTKY STRUCTURES; THERMIONIC EMISSION CURRENT;

SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0031996326     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(97)00237-2     Document Type: Article

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