XPS studies on the oxidation behavior of SiC particles

Materials Research Bulletin

Volumn 33, Issue 2, 1998, Pages 189-198

  Sreemany, M ^a   Ghosh, T B ^a   Pai, B C ^b   Chakraborty, M ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b REGIONAL RESEARCH LABORATORY CSIR   (India)

Author keywords

A. carbides; A. interfaces; A. oxides; A. surfaces; C. photoelectron spectroscopy

Indexed keywords

CARBON; OXIDATION; SILICA; SURFACE CHEMISTRY; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER PARAMETERS;

SILICON CARBIDE;

EID: 0031995493     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(97)00222-5     Document Type: Article

References (34)

1. R. Kaplan, P.H. Klein, and A. Addamiano, J. Appl. Phys. 58, 321 (1985).
2. R. Kaplan and T.M. Parrill, Surf. Sci. 165, L45 (1986).
3. K.M. Geib, C.W. Wilmsen, J.E. Mahan, and M.C. Bost, J. Appl. Phys. 61, 5299 (1987).
4. V.M. Bermudez, J. Appl. Phys. 63, 4951 (1988).
5. K.G. Satyanarayana, R.M. Pillai, and B.C. Pai, in Synthesis and Properties, Handbook of Ceramics and Composites Series, Vol. 1, ed. N.P. Chermisinoff, p. 555, Marcel Dekker, New York (1989).
6. T. Iseki, T. Kameda, and T. Maruyama, J. Mater. Sci. 19 1692 (1984).
7. T. Christman and S. Suresh, Acta Metall. 36, 1691 (1988).
8. Y. Flom and R. J. Arsenault, Acta Metall. 37, 2413 (1989).
9. N. Wang, Z. Wang, and G.L. Weatherly, in Proceedings of Fabrication of Particulate Reinforced Metal Composites, ed. J. Masounave and F.G. Hamel, p. 145, ASM International, Metals Park, OH (1990).
10. B. Hallsteadt, Z.K. Lie, and J. Ogren, Mater. Sci. Eng. A 129, 135 (1990).
11. H. Ribes, M. Suery, G. L'Esperance, and J.G. Legoux, Metall. Trans. A 21, 2489 (1990).
12. L. Salvo, G. L'Esperance, M. Suery, and J.G. Legoux, Mater. Sci. Eng. A 177, 173 (1994).
13. J.M. Howe, Int. Mater. Rev. 38, 233 (1993).
14. K. Miyoshi and D.H. Buckley, Appl. Surf. Sci. 10, 357 (1982).
15. C.D. Wagner, D.E. Passoja, H.F. Hillary, T.G. Kinisky, H.A. Six, W.T. Jansen, and J.A. Taylor, J. Vac. Sci. Technol. 21, 933 (1982).
16. M.L. Miller and R.W. Linton, Anal. Chem. 57, 2314 (1985).
17. M. Yoshimura, J. Kase, and S. Somiya, J. Mater. Res. 1, 100 (1986).
18. B. Jorgensen and P. Morgen, J. Vac. Sci. Technol. A 4, 1701 (1986).
19. Y. Mizokawa, K.M. Geib, and C.W. Wilmsen, J. Vac. Sci. Technol. A 4, 1696 (1986).
20. L. Muehlhoff, W.J. Choyke, M.J. Bozack, and J.T. Yater, Jr., J. Appl. Phys. 60, 2842 (1986).
21. L. Porte, J. Appl. Phys. 60, 635 (1986).
22. T.N. Taylor, J. Vac. Sci. Technol. A 6, 982 (1988).
23. K.R. Karasek, S.A. Bradley, J.T. Donne, H.C. Yeb, J.L. Schienle, and H.T. Fang, J. Am. Ceram. Soc. 72, 1907 (1989).
24. M.I. Chaudhry, J. Mater. Res. 4, 404 (1989).
25. V. M. Bermudez, J. Appl. Phys. 66, 6084 (1989).
26. Y. Mizokawa, S. Nakanishi, O. Komoda, and S. Miyase, J. Appl. Phys. 67, 264 (1990).
27. H.M. Hsu, Surf. Interface Anal. 18, 159 (1992).
28. T.L. Barr, in Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, ed. D. Briggs and M.P. Seah, p. 330, Wiley & Sons, Great Britain (1983).
29. T.B. Ghosh and M. Sreemany, Appl. Surf. Sci. 64, 59 (1993).
30. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, ed. by D. Briggs and M.P. Seah, p. 551, Wiley & Sons, Great Britain (1983).
31. C.D. Wagner, in Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, ed. D. Briggs and M.P. Seah, p. 477, Wiley & Sons, Great Britain (1983).
32. P. Swift, Surf. Interface Anal. 4, 47 (1982).
33. D. Briggs and J.C. Rivière, in Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, p. 133, ed. D. Briggs and M.P. Seah, Wiley & Sons, Great Britain (1983).
34. S. Tanuma, C.J. Powell, and D.R. Penn, Surf. Interface Anal. 11, 577 (1988).