A stochastic regime switching model for the failure process of a repairable system

Reliability Engineering and System Safety

Volumn 59, Issue 2, 1998, Pages 225-238

  Lim, Tae Jin ^a  

^a Soongsil University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

MARKOV PROCESSES; MATHEMATICAL MODELS; POISSON DISTRIBUTION; RANDOM PROCESSES; REPAIR; WEIBULL DISTRIBUTION;

FAILURE PROCESS; REPAIRABLE SYSTEM; SWITCHING MODEL;

FAILURE ANALYSIS;

EID: 0031988570     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(97)00128-2     Document Type: Article

References (11)

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