Huffman encoding of test sets for sequential circuits

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 1, 1998, Pages 21-25

  Iyengar, Vikram ^a   Chakrabarty, Krishnendu ^a   Murray, Brian T ^b  

^a Boston University   (United States)

^b GENERAL MOTORS CORPORATION   (United States)

Author keywords

Decoding methods; Huffman codes; Sequential circuit testing; Statistical encoding; Tester memory; Tester pattern depth

Indexed keywords

DATA STORAGE EQUIPMENT; SIGNAL ENCODING; STATISTICAL TESTS;

HUFFMAN CODES; SEQUENTIAL CIRCUITS;

NETWORKS (CIRCUITS);

EID: 0031988325     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.728782     Document Type: Article

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