Photoacoustic depth profiling of layered samples

Analyst

Volumn 123, Issue 4, 1998, Pages 547-550

  Kopp, C ^a   Niessner, R ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Depth resolved; Layered samples; Photoacoustic spectrometry; Pulsed excitation; Waveform reconstruction

Indexed keywords

ACOUSTICS; ANALYTIC METHOD; CONFERENCE PAPER; PHOTOACOUSTIC SPECTROSCOPY; SPECTROMETRY;

EID: 0031968230     PISSN: 00032654     EISSN: None     Source Type: Journal    
DOI: 10.1039/a707114k     Document Type: Conference Paper

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