On-line sampling and intact mass analysis of nanometer-size aerosols via time-of-flight high-mass spectrometry

Journal of Aerosol Science

Volumn 29, Issue 1-2, 1998, Pages 115-127

  Alvarez, Marcos M ^a   Vezmar, Igor ^a   Whetten, Robert L ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC PRESSURE; ELECTRIC FIELDS; ELECTRON BEAMS; EXCIMER LASERS; MASS SPECTROMETRY; MOLECULAR BEAMS; NANOSTRUCTURED MATERIALS; PARAFFINS; PARTICLE SIZE ANALYSIS; PHOTOIONIZATION; SULFUR COMPOUNDS; ULTRAVIOLET RADIATION;

THIOL; TIME-OF-FLIGHT MASS SPECTROMETRY (TOFMS);

AEROSOLS;

ATMOSPHERIC AEROSOL; MASS ANALYSIS; SAMPLING; SPECTROMETRY;

AIR POLLUTION; AIR SAMPLING; AIRBORNE PARTICLE; ARTICLE; DEVICE; EXCIMER LASER; MASS SPECTROMETRY; PARTICLE SIZE; PRESSURE; PRIORITY JOURNAL;

EID: 0031964724     PISSN: 00218502     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0021-8502(97)00041-4     Document Type: Article

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