Characterization of 25-75 nm phases found at the periphery of multiphase inclusions: Techniques comparison and selection

Journal of Microscopy

Volumn 189, Issue 3, 1998, Pages 249-262

  Blais, C ^a   L'Esperance G ^a   Baril, E ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

(P)EELS imaging; Carbon extraction replicas; EDS; Inclusions; SEM; TEM; Ultramicrotomy

Indexed keywords

CARBON; CRYSTAL STRUCTURE; DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; EXTRACTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SPECTROMETRY; WELDS;

(P)EELS IMAGING; CARBON EXTRACTION REPLICA; CHARACTERIZATION TECHNIQUES; ENERGY DISPERSIVE SPECTROMETRY; INCLUSIONS IN STEELS; MULTIPHASES; PARALLEL ELECTRON ENERGY LOSS SPECTROSCOPIES; STEEL WELDS; TEM; ULTRA-MICROTOMY;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; CELL STRUCTURE; ELECTRON DIFFRACTION; EXTRACTION; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY; ULTRAMICROTOMY;

RESEDA LUTEOLA;

EID: 0031918032     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.00303.x     Document Type: Article

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