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Volumn 74, Issue 3, 1998, Pages 1421-1427

Effect of substrate roughness on D spacing supports theoretical resolution of vapor pressure paradox

Author keywords

[No Author keywords available]

Indexed keywords

PHOSPHATIDYLCHOLINE;

EID: 0031910473     PISSN: 00063495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0006-3495(98)77854-3     Document Type: Article
Times cited : (21)

References (20)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.