Low cost image-capture system for a scanning electron microscope

Journal of Microscopy

Volumn 191, Issue 2, 1998, Pages 113-115

  Egerton, R F ^a   Wan, L ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b Public Carrier Networks   (Canada)

Author keywords

Digital image acquisition; Scanning electron microscope (SEM)

Indexed keywords

IMAGE ACQUISITION; SCANNING ELECTRON MICROSCOPY; VISUAL BASIC;

CAPTURE SYSTEM; DATA ACQUISITION BOARD; DIGITAL IMAGE; DIGITAL IMAGE ACQUISITION; IMAGE CAPTURES; LOW-COSTS; NATIONAL INSTRUMENTS; PC-BASED; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRONS;

DATA ACQUISITION;

ARTICLE; COMPUTER PROGRAM; COST EFFECTIVENESS ANALYSIS; ELECTRON BEAM; IMAGE PROCESSING; MONITORING; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 0031869896     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.00395.x     Document Type: Article

References (1)

1. Postek, M.T. & Vladar, A.E. (1997) Inexpensive digital imaging? Scanning, 19, 197-199.