Development of RAPD and SCAR markers linked to the Russian wheat aphid resistance gene Dn2 in wheat

Theoretical and Applied Genetics

Volumn 96, Issue 8, 1998, Pages 1162-1169

  Myburg, A A ^a,b   Cawood, M ^a   Wingfield, B D ^a,c   Botha, A M ^a,c  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF PRETORIA   (South Africa)

Author keywords

Dn2 resistance gene; RAPD; Russian wheat aphid; SCAR; Wheat

Indexed keywords

APHID; DISEASE RESISTANCE; IDENTIFICATION; NEAR ISOGENIC LINE; RANDOM AMPLIFIED POLYMORPHIC DNA; RESISTANCE GENE; RESISTANCE MANAGEMENT; SEGREGATION ANALYSIS; SEQUENCE CHARACTERIZED AMPLIFIED REGION; WHEAT;

DIURAPHIS NOXIA;

EID: 0031853035     PISSN: 00405752     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001220050852     Document Type: Article

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