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Volumn 20, Issue 2, 1998, Pages 83-86

Reproducibility and accuracy of spatial measurements from digitally captured images in the environmental scanning electron microscope

Author keywords

Calibration; Environmental scanning electron microscope; Scanning electron microscope; Spatial

Indexed keywords

ACCURACY; ARTICLE; CALIBRATION; HUMIDITY; IMAGE ANALYSIS; PRIORITY JOURNAL; REPRODUCIBILITY; SCANNING ELECTRON MICROSCOPY;

EID: 0031816290     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.1998.4950200203     Document Type: Article
Times cited : (2)

References (3)
  • 1
    • 0027290520 scopus 로고
    • Introduction to the ESEM instrument
    • Danilatos GD: Introduction to the ESEM instrument. Microsc Res Techn 25, 354-361 (1993)
    • (1993) Microsc Res Techn , vol.25 , pp. 354-361
    • Danilatos, G.D.1
  • 2
    • 0001173844 scopus 로고
    • Critical issues in scanning electron microscope metrology
    • Postek MT: Critical issues in scanning electron microscope metrology. J Res NIST 99 (5), 641-671 (1994)
    • (1994) J Res NIST , vol.99 , Issue.5 , pp. 641-671
    • Postek, M.T.1
  • 3
    • 0000158717 scopus 로고
    • Interlaboratory study on the lithography produced scanning electron microscope magnification standard prototype
    • Postek MT, Vladár AE, Jones S. Keery WJ: Interlaboratory study on the lithography produced scanning electron microscope magnification standard prototype. J Res NIST 98 (4), 447-467 (1993)
    • (1993) J Res NIST , vol.98 , Issue.4 , pp. 447-467
    • Postek, M.T.1    Vladár, A.E.2    Jones, S.3    Keery, W.J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.