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Volumn 83, Issue 5-6, 1998, Pages 546-552
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Quantitative measurement of short compositional profiles using analytical transmission electron microscopy
a
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Author keywords
[No Author keywords available]
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Indexed keywords
BINARY ALLOYS;
DIFFUSION;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
IRON ALLOYS;
MAGNESIUM ALLOYS;
MAGNESIUM METALLOGRAPHY;
OLIVINE;
TRANSMISSIONS;
ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY;
COMPOSITIONAL GRADIENTS;
CONTROLLED LABORATORIES;
FE-MG INTERDIFFUSION;
INTERFACIAL REGION;
PROFILE MEASUREMENT;
QUANTITATIVE MEASUREMENT;
QUANTITATIVE MODELING;
IRON METALLOGRAPHY;
ATEM;
MINERAL COMPOSITION;
OLIVINE;
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EID: 0031814781
PISSN: 0003004X
EISSN: None
Source Type: Journal
DOI: 10.2138/am-1998-5-615 Document Type: Article |
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Times cited : (24)
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References (0)
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