-
3
-
-
0022687691
-
Hydriding and Dehydriding characteristics of mechanically alloyed mixtures Mg-×wt.%Ni (x = 5, 10, 25 and 55)
-
Song M Y, Ivanov E, Darriet B, Pezat M, and Hagenmuller P (1987) Hydriding and Dehydriding characteristics of mechanically alloyed mixtures Mg-×wt.%Ni (x = 5, 10, 25 and 55). J. Less-Common Met. 131: 71-79.
-
(1987)
J. Less-Common Met.
, vol.131
, pp. 71-79
-
-
Song, M.Y.1
Ivanov, E.2
Darriet, B.3
Pezat, M.4
Hagenmuller, P.5
-
8
-
-
0029513688
-
Mechanical alloying of Mg-Ni compounds under hydrogen and inert atmosphere
-
Huot J, Akiba E, and Takada T (1995) Mechanical alloying of Mg-Ni compounds under hydrogen and inert atmosphere. J. Alloys Comp. 231: 815-819.
-
(1995)
J. Alloys Comp.
, vol.231
, pp. 815-819
-
-
Huot, J.1
Akiba, E.2
Takada, T.3
-
10
-
-
0029731499
-
2Ni-H system synthesized by reactive mechanical grinding
-
2Ni-H system synthesized by reactive mechanical grinding. J. Alloys Comp. 232: L16-L19.
-
(1996)
J. Alloys Comp.
, vol.232
-
-
Orimo, S.1
Fujii, H.2
-
12
-
-
0030855596
-
2Ni-H system synthesized by reactive mechanical grinding
-
2Ni-H system synthesized by reactive mechanical grinding. Acta Mater. 45: 331-341.
-
(1997)
Acta Mater.
, vol.45
, pp. 331-341
-
-
Orimo, S.1
Fujii, H.2
Ikeda, K.3
-
15
-
-
0031130585
-
Hydriding properties of a nano-/amorphous-structured Mg-Ni-H system
-
Orimo S, Fujii H, Ikeda K, Fujikawa Y, and Kitano Y (1997) Hydriding properties of a nano-/amorphous-structured Mg-Ni-H system. J. Alloys Comp. 253/254: 94-97.
-
(1997)
J. Alloys Comp.
, vol.253-254
, pp. 94-97
-
-
Orimo, S.1
Fujii, H.2
Ikeda, K.3
Fujikawa, Y.4
Kitano, Y.5
-
16
-
-
0031166224
-
Structural and hydriding properties of the Mg-Ni-H system with nano- and/or amorphous structures
-
Orimo S, Ikeda K, Fujii H, Fujikawa Y, Kitano Y, and Yamamoto K (1997) Structural and hydriding properties of the Mg-Ni-H system with nano- and/or amorphous structures. Acta Mater. 45: 2271-2278.
-
(1997)
Acta Mater.
, vol.45
, pp. 2271-2278
-
-
Orimo, S.1
Ikeda, K.2
Fujii, H.3
Fujikawa, Y.4
Kitano, Y.5
Yamamoto, K.6
-
17
-
-
0031224426
-
x) (T = 3d transition metals; x = 0, 0.2, 0.4 and 0.5)
-
x) (T = 3d transition metals; x = 0, 0.2, 0.4 and 0.5). J. Alloys Camp. 260: 143-146.
-
(1997)
J. Alloys Camp.
, vol.260
, pp. 143-146
-
-
Orimo, S.1
Ikeda, K.2
Fujii, H.3
Yamamoto, K.4
-
18
-
-
0000296375
-
Cross-sectional transmission electron microscopy of precisely selected region from semi-conductor devices
-
Kirk E C G, Williams D A, and Ahmed H (1989) Cross-sectional transmission electron microscopy of precisely selected region from semi-conductor devices. Inst. Phys. Conf. Ser. 100: 501-506.
-
(1989)
Inst. Phys. Conf. Ser.
, vol.100
, pp. 501-506
-
-
Kirk, E.C.G.1
Williams, D.A.2
Ahmed, H.3
-
19
-
-
0000900485
-
Focused ion beam micromachining for transmission electron microscopy specimen preparation of semiconductor laser diodes
-
Szot J, Hornsey R, Ohnishi T, and Minagawa S (1992) Focused ion beam micromachining for transmission electron microscopy specimen preparation of semiconductor laser diodes. J. Vac. Sci. Technol B 10: 575-579.
-
(1992)
J. Vac. Sci. Technol B
, vol.10
, pp. 575-579
-
-
Szot, J.1
Hornsey, R.2
Ohnishi, T.3
Minagawa, S.4
-
20
-
-
0026918549
-
Application of the focused-ion-beam technique for preparing the cross-sectional sample of chemical vapor deposition diamond thin film for high-resolution transmission electron microscope observation
-
Tarutani M, Takai Y, and Shimizu R (1992) Application of the focused-ion-beam technique for preparing the cross-sectional sample of chemical vapor deposition diamond thin film for high-resolution transmission electron microscope observation. Jpn. J. Appl. Phys. 31: L1305-L1308.
-
(1992)
Jpn. J. Appl. Phys.
, vol.31
-
-
Tarutani, M.1
Takai, Y.2
Shimizu, R.3
-
21
-
-
0001100708
-
Transmission electron microscopy specimen preparation technique using focused ion beam fabrication: Application to GaAs metal-semiconductor field effect transistor
-
Yamaguchi A, Shibata M, and Hashinaga T (1993) Transmission electron microscopy specimen preparation technique using focused ion beam fabrication: Application to GaAs metal-semiconductor field effect transistor. J. Vac. Sci. Technol. B 11: 2016-2020.
-
(1993)
J. Vac. Sci. Technol. B
, vol.11
, pp. 2016-2020
-
-
Yamaguchi, A.1
Shibata, M.2
Hashinaga, T.3
-
22
-
-
7844248591
-
Cross-sectional TEM specimens preparation of precisely selected regions of semiconductor devices using focused ion beam milling
-
Kim C T, Kim H J, Cho Y S, and Choi S H (1993) Cross-sectional TEM specimens preparation of precisely selected regions of semiconductor devices using focused ion beam milling. Korean J. Mat. Sci. 3: 193-196.
-
(1993)
Korean J. Mat. Sci.
, vol.3
, pp. 193-196
-
-
Kim, C.T.1
Kim, H.J.2
Cho, Y.S.3
Choi, S.H.4
-
23
-
-
0028421923
-
Surface and interface study of titanium nitride on Si substrate produced by dynamic ion beam mixing method
-
Beag Y W, Tarutani M, Min K, Kiuchi M, and Shimizu R (1994) Surface and interface study of titanium nitride on Si substrate produced by dynamic ion beam mixing method. Jpn. J. Appl. Phys. 33: 2025-2030.
-
(1994)
Jpn. J. Appl. Phys.
, vol.33
, pp. 2025-2030
-
-
Beag, Y.W.1
Tarutani, M.2
Min, K.3
Kiuchi, M.4
Shimizu, R.5
-
24
-
-
2642631676
-
Transmission electron microscope sample preparation using a focused ion beam
-
Ishitani T, Tsuboi H, Yaguchi T, and Koike H (1995) Transmission electron microscope sample preparation using a focused ion beam. J. Electron Microsc. 44: 331-336.
-
(1995)
J. Electron Microsc.
, vol.44
, pp. 331-336
-
-
Ishitani, T.1
Tsuboi, H.2
Yaguchi, T.3
Koike, H.4
-
25
-
-
0000094650
-
TEM observation of mechanically alloyed powder particles (MAPP) of Mg-Zn alloy thinned by the FIB cutting technique
-
Kitano Y, Fujikawa Y, Takeshita H, Kamino T, Yaguchi T, Matsumoto H, and Koike H (1995) TEM observation of mechanically alloyed powder particles (MAPP) of Mg-Zn alloy thinned by the FIB cutting technique. J. Electron Microsc. 44: 376-383.
-
(1995)
J. Electron Microsc.
, vol.44
, pp. 376-383
-
-
Kitano, Y.1
Fujikawa, Y.2
Takeshita, H.3
Kamino, T.4
Yaguchi, T.5
Matsumoto, H.6
Koike, H.7
-
26
-
-
77958401682
-
TEM observation of micrometer-sized Ni powder particles thinned by FIB cutting technique
-
Kitano Y, Fujikawa Y, Kamino T, Yaguchi T, and Saka H (1995) TEM observation of micrometer-sized Ni powder particles thinned by FIB cutting technique. J. Electron Microsc. 44: 410-413.
-
(1995)
J. Electron Microsc.
, vol.44
, pp. 410-413
-
-
Kitano, Y.1
Fujikawa, Y.2
Kamino, T.3
Yaguchi, T.4
Saka, H.5
-
27
-
-
0027911169
-
Metastable melting phenomena and solid state amorphization (SSA) by mechanical alloying
-
Shingu P H and Ishihara K N (1993) Metastable melting phenomena and solid state amorphization (SSA) by mechanical alloying. J. Alloys Comp. 194: 319-324.
-
(1993)
J. Alloys Comp.
, vol.194
, pp. 319-324
-
-
Shingu, P.H.1
Ishihara, K.N.2
-
28
-
-
0004065549
-
-
North-Holland, Amsterdam
-
de Boer F R, Boom R, Mattens W C M, Miedema A R, and Niessen A K (1988) Cohesion in Metals - Transition Metal Alloys, p. 299, (North-Holland, Amsterdam).
-
(1988)
Cohesion in Metals - Transition Metal Alloys
, pp. 299
-
-
De Boer, F.R.1
Boom, R.2
Mattens, W.C.M.3
Miedema, A.R.4
Niessen, A.K.5
|