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Volumn 12, Issue 20, 1998, Pages 1463-1474

A new linear ion trap time-of-flight system with tandem mass spectrometry capabilities

Author keywords

[No Author keywords available]

Indexed keywords

EQUIPMENT DESIGN; MASS SPECTROMETRY;

EID: 0031763316     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(19981030)12:20<1463::AID-RCM357>3.0.CO;2-H     Document Type: Article
Times cited : (136)

References (64)
  • 23
    • 85153545340 scopus 로고    scopus 로고
    • U.S. Patent 5,420,549 Extended linear ion trap frequency standard apparatus (1994)
    • J. D. Prestage, U.S. Patent 5,420,549 Extended linear ion trap frequency standard apparatus (1994).
    • Prestage, J.D.1
  • 28
    • 85153554105 scopus 로고    scopus 로고
    • U.S. Patent 5,420,425 Ion trap mass spectrometer system and method (1994)
    • M. E. Bier and J. E. P. Syka, U.S. Patent 5,420,425 Ion trap mass spectrometer system and method (1994).
    • Bier, M.E.1    Syka, J.E.P.2
  • 29
    • 85153538788 scopus 로고    scopus 로고
    • U.S. Patent 4,755,670 Fourier Transform Quadrupole Mass Spectrometer and Method (1986)
    • J. P. Syka and W. J. Fies Jr., U.S. Patent 4,755,670 Fourier Transform Quadrupole Mass Spectrometer and Method (1986).
    • Syka, J.P.1    Fies Jr., W.J.2
  • 30
    • 85153549116 scopus 로고    scopus 로고
    • U.S. Patent 5 179,278 Multipole inlet system for ion traps (1993)
    • D. J. Douglas, U.S. Patent 5 179,278 Multipole inlet system for ion traps (1993).
    • Douglas, D.J.1
  • 33
    • 85153541061 scopus 로고    scopus 로고
    • PCT WO 98/06481 Multipole ion guide in trap mass spectrometry (1997)
    • C. M. Whitehouse, T. Dresch and B. A. Andrien, PCT WO 98/06481 Multipole ion guide in trap mass spectrometry (1997).
    • Whitehouse, C.M.1    Dresch, T.2    Andrien, B.A.3
  • 45
    • 85153555290 scopus 로고    scopus 로고
    • U.S. Patent 3,147,445 Quadrupole focusing means for charged particle containment (1959)
    • R. F. Wuerker and R. V. Langmuir, U.S. Patent 3,147,445 Quadrupole focusing means for charged particle containment (1959).
    • Wuerker, R.F.1    Langmuir, R.V.2
  • 48
    • 85153554363 scopus 로고    scopus 로고
    • U.S. Patent 5,689,111 Ion storage time-of-flight mass spectrometer (1997)
    • T. Dresch, E. E. Gulcicek and C. Whitehouse, U.S. Patent 5,689,111 Ion storage time-of-flight mass spectrometer (1997).
    • Dresch, T.1    Gulcicek, E.E.2    Whitehouse, C.3
  • 54
    • 85153548843 scopus 로고    scopus 로고
    • U.S. Patent, 5,696,375 Multideflector (1997)
    • M. Park and C. Köster, U.S. Patent, 5,696,375 Multideflector (1997).
    • Park, M.1    Köster, C.2
  • 55
    • 85153543045 scopus 로고    scopus 로고
    • U.S. Patent 5,654,544 Mass resolution by angular alignment of the ion detector conversion surface in the time-of-flight mass spectrometers withelectrostatic steering deflectors (1996)
    • T. Dresch, U.S. Patent 5,654,544 Mass resolution by angular alignment of the ion detector conversion surface in the time-of-flight mass spectrometers withelectrostatic steering deflectors (1996).
    • Dresch, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.