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Volumn 62, Issue 11, 1998, Pages 1919-1923

A new approach to pH of point of zero charge measurement: crystal-face specificity by scanning force microscopy (SFM)

Author keywords

[No Author keywords available]

Indexed keywords

AQUEOUS SOLUTION; CRYSTAL; GEOCHEMISTRY; MICROSCOPY; PH; SOLUTE;

EID: 0031725280     PISSN: 00167037     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0016-7037(98)00119-7     Document Type: Article
Times cited : (59)

References (23)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.