A high resolving power ion selector for post-source decay measurements in a reflecting time-of-flight mass spectrometer

Rapid Communications in Mass Spectrometry

Volumn 12, Issue 22, 1998, Pages 1655-1664

  Piyadasa, C K G ^a   Hakansson P ^b   Ariyaratne, T R ^a   Barofsky, D F ^c  

^a UNIVERSITY OF COLOMBO   (Sri Lanka)

^b UPPSALA UNIVERSITY   (Sweden)

^c OREGON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESORPTION; ELECTRIC FIELDS; ELECTRODES; FULL WIDTH AT HALF MAXIMUM; ISOTOPES; MASS SPECTROMETERS; PROTONATION;

DECAY MEASUREMENTS; ELECTROSTATIC DEFLECTORS; FULL WIDTHS AT HALF MAXIMUMS; POSTSOURCE DECAY; PROTONATED; SUBSTANCE-P; THIN METALS; TIME-CONSTANTS; TIME-OF-FLIGHT MASS SPECTROMETERS; VELOCITY SELECTION;

IONS;

EID: 0031721319     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(19981130)12:22<1655::AID-RCM383>3.0.CO;2-C     Document Type: Article

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