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Volumn 10, Issue 3, 1998, Pages 453-460

Crystal-structure refinement of synthetic Fe- and Mg-staurolite by Rietveld analysis of X-ray powder-diffraction data

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; RIETVELD ANALYSIS; RIETVELD REFINEMENT; X RAY POWDER DIFFRACTION; X RAYS;

EID: 0031713218     PISSN: 09351221     EISSN: None     Source Type: Journal    
DOI: 10.1127/ejm/10/3/0453     Document Type: Article
Times cited : (8)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.