Pattern recognition for statistical process control charts

International Journal of Advanced Manufacturing Technology

Volumn 14, Issue 2, 1998, Pages 99-109

  Wang, Jiemin ^a   Kochhar, A K ^a   Hannam, R G ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Control charts; Pattern recognition; Patterns; Statistical process control

Indexed keywords

COMPUTER AIDED MANUFACTURING; STATISTICAL PROCESS CONTROL;

CONTROL CHARTS;

PATTERN RECOGNITION SYSTEMS;

EID: 0031707658     PISSN: 02683768     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF01322218     Document Type: Article

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