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Volumn 123-124, Issue , 1998, Pages 669-673

Film quality effects associated with formation of misfit dislocations at semiconductor interfaces

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; FILM GROWTH; SEMICONDUCTING FILMS; SEMICONDUCTOR GROWTH; STRAIN; STRESS RELAXATION; SUBSTRATES; SURFACE PROPERTIES; VECTORS;

EID: 0031706926     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00559-X     Document Type: Article
Times cited : (11)

References (10)
  • 3
    • 0042157764 scopus 로고    scopus 로고
    • E.I. Givargizov, A.M. Melnikova (Eds.), Plenum, New York
    • E.M. Trukhanov, in: E.I. Givargizov, A.M. Melnikova (Eds.), Growth of Crystals, vol. 20, Plenum, New York, 1996, p. 29.
    • (1996) Growth of Crystals , vol.20 , pp. 29
    • Trukhanov, E.M.1
  • 4
    • 0041656848 scopus 로고
    • in Russian
    • E.M. Trukhanov, Surface 2 (1995) 13, in Russian.
    • (1995) Surface , vol.2 , pp. 13
    • Trukhanov, E.M.1
  • 5
    • 0041656847 scopus 로고
    • in Russian
    • E.M. Trukhanov, Surface 2 (1995) 22, in Russian.
    • (1995) Surface , vol.2 , pp. 22
    • Trukhanov, E.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.