Random effects linear models for process mean and variance

Journal of Quality Technology

Volumn 30, Issue 1, 1998, Pages 33-39

  Sohn, So Young ^a,c,d   Park, C J ^b,c  

^a Yonsei University   (South Korea)

^b SAN DIEGO STATE UNIVERSITY   (United States)

^c Dept of Indust Syst Engineering ^*

^d ASQ   (South Korea)

Author keywords

Bayesian Methods; Quality Control; Random Effects; Robust Design

Indexed keywords

MATHEMATICAL MODELS; PROCESS CONTROL; RANDOM PROCESSES; SENSITIVITY ANALYSIS; SENSORS; STATISTICAL METHODS;

BAYES METHODS; RANDOM EFFECTS LINEAR MODELS;

QUALITY CONTROL;

EID: 0031704629     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.1998.11979817     Document Type: Article

References (7)

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