Steady state thermal characterization of multiple output devices using linear superposition theory and a non-linear matrix multiplier

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 1998, Pages 39-46

  Zahn, Bret A ^a  

^a Abpac Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR CORRECTION; HEAT RADIATION; MATRIX ALGEBRA; MULTIPLYING CIRCUITS; NATURAL CONVECTION; NONLINEAR EQUATIONS; SEMICONDUCTOR DEVICE MODELS; TRANSISTORS;

MULTIPLE OUTPUT DEVICES; STEADY STATE THERMAL CHARACTERIZATION;

ELECTRONICS PACKAGING;

EID: 0031704318     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)