Characterization of Surface Fault Patterns with Application to a Layered Manufacturing Process

Journal of Manufacturing Systems

Volumn 17, Issue 1, 1998, Pages 23-36

  Tumer, Irem Y ^a,b   Thompson, David C ^a,b   Wood, Kristin L ^a,b   Crawford, Richard H ^a,b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b The University of Texas at Austin   (United States)

Author keywords

Fault Detection; Fault Diagnosis; Fault Patterns; Manufacturing Surfaces; Part Quality; Selective Laser Sintering; Surface Quality

Indexed keywords

LASER APPLICATIONS; MONITORING; PROCESS CONTROL; QUALITY CONTROL; RANDOM PROCESSES; SINTERING; SURFACE TREATMENT;

LAYERED MANUFACTURING PROCESS; SELECTIVE LASER SINTERING (SLS); SURFACE FAULT PATTERNS;

COMPUTER AIDED MANUFACTURING;

EID: 0031704034     PISSN: 02786125     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0278-6125(98)80007-1     Document Type: Article

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