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Volumn 12, Issue 1, 1998, Pages 56-58

Reduction of solder defects under nitrogen

Author keywords

[No Author keywords available]

Indexed keywords

MANUFACTURE; NITROGEN; OXYGEN; SOLDERING ALLOYS;

EID: 0031703859     PISSN: 15298930     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (6)
  • 1
    • 31344475439 scopus 로고    scopus 로고
    • Inert IR/Reflow: The Significance of Oxygen Concentration in Nitrogen and Nitrogen-Hydrogen Atmospheres
    • San Jose, Calif.
    • C. Lea, "Inert IR/Reflow: The Significance of Oxygen Concentration in Nitrogen and Nitrogen-Hydrogen Atmospheres," Proceedings of Surface Mount International '91, San Jose, Calif.
    • Proceedings of Surface Mount International '91
    • Lea, C.1
  • 2
    • 0027541070 scopus 로고
    • Effect of Adventitious Oxygen on Nitrogen-Inerted IR Reflow Soldering with Low-Residue Pastes
    • P.F. Stratton, et.al., "Effect of Adventitious Oxygen on Nitrogen-Inerted IR Reflow Soldering with Low-Residue Pastes," Soldering and Surface Mount Technology, No. 13, 1993.
    • (1993) Soldering and Surface Mount Technology , vol.13
    • Stratton, P.F.1
  • 4
    • 11744349700 scopus 로고
    • Benefits of Inerting a No-Clean Wave Soldering Process
    • May
    • D.E. Anderson, "Benefits of Inerting a No-Clean Wave Soldering Process," IPC National No-Clean Conference, May 1993.
    • (1993) IPC National No-Clean Conference
    • Anderson, D.E.1
  • 5
    • 11744370692 scopus 로고
    • Process Cost Benefits When Soldering with No-Clean Fluxes in an Inert Atmosphere
    • May
    • L. Hymes and T. Pitsch, "Process Cost Benefits When Soldering with No-Clean Fluxes in an Inert Atmosphere," IPC National No-Clean Conference, May 1993.
    • (1993) IPC National No-Clean Conference
    • Hymes, L.1    Pitsch, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.