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Volumn 41, Issue 3, 1998, Pages 96-99
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Outgassing Properties of Chemically Polished Stainless Steels
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
DEGASSING;
ELECTROLYTIC POLISHING;
OPTIMIZATION;
SCANNING ELECTRON MICROSCOPY;
STAINLESS STEEL;
VACUUM APPLICATIONS;
STAINLESS STEEL SUS304L;
ULTRAHIGH VACUUM (UHV);
CHEMICAL POLISHING;
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EID: 0031702585
PISSN: 05598516
EISSN: None
Source Type: Journal
DOI: 10.3131/jvsj.41.96 Document Type: Article |
Times cited : (11)
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References (7)
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