Continuously-calibrated 10 MSample/s 12 b 3.3 V ADC

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 1998, Pages 144-145,-427

  Ingino Jr , Joseph ^a   Wooley, Bruce ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CMOS INTEGRATED CIRCUITS; COMPARATOR CIRCUITS; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO; TIMING CIRCUITS;

ANALOG CIRCUITS;

ANALOG TO DIGITAL CONVERSION;

EID: 0031702318     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)