Experimental testing of thermal interface materials on non-planar surfaces

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 1998, Pages 88-94

  Dean, Nancy F ^a   Gettings, Amy L ^a  

^a Assembly Products Group   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT RESISTANCE; INTERFACES (MATERIALS); STANDARDS; SURFACE TESTING; THERMAL CONDUCTIVITY OF SOLIDS;

THERMAL INTERFACE MATERIALS;

ELECTRONICS PACKAGING;

EID: 0031701712     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)