Retention studies on ferroelectric media for high data storage application

Materials Research Society Symposium - Proceedings

Volumn 493, Issue , 1998, Pages 299-304

  Yoo, I K ^a   Kim, B M ^a   Kim, D S ^a   Park, S J ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DATA STORAGE EQUIPMENT; ELECTRIC FIELD EFFECTS; ELECTRODES; POLARIZATION;

FERROELECTRIC CAPACITORS;

FERROELECTRIC MATERIALS;

EID: 0031701360     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)