Application of spectral analysis for crystal shape improvement during czochralski growth of oxide crystals

Crystal Research and Technology

Volumn 33, Issue 1, 1998, Pages 65-70

  Kochurikhin, V V ^a   Shimamura, K ^a   Epelbum, B M ^a   Takeda, H ^a   Fukuda, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT OSCILLATIONS; CONTROL SYSTEMS; CRYSTAL STRUCTURE; LANTHANUM COMPOUNDS; OXIDES; PROCESS CONTROL; SINGLE CRYSTALS; SPECTRUM ANALYSIS;

CRYSTAL SHAPE CONTROL; OXIDE CRYSTALS;

CRYSTAL GROWTH FROM MELT;

EID: 0031699614     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1521-4079(1998)33:1<65::aid-crat65>3.0.co;2-s     Document Type: Article

References (5)

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2. JUHASZ Z., SZABO G.: J. Ctyst. Growth 79 (1986) 303
3. KOCHURIKHIN V.V., SIUAMURA K., FUKUDA T.: Cryst. Res. Technol. 31 (1996) 789
4. MILLER D.C., VALENTINO A.J., SHICK L.K.: J. Cryst., Growth 44 (1978) 121
5. SHIMAMURA K., TAKEDA H., KOHNO T., FUKUDA T.: J. Cryrt. Growth 163 (1996) 388