Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy

Materials Research Society Symposium - Proceedings

Volumn 493, Issue , 1998, Pages 53-58

  Gruverman, A ^a   Prakash, S A ^a   Aggarwal, S ^a   Ramesh, R ^a   Auciello, O ^a   Tokumoto, H ^a  

^a Technology (JRCAT)   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAIN BOUNDARIES; MAGNETIC DOMAINS; NANOSTRUCTURED MATERIALS; POLARIZATION; THIN FILMS;

SCANNING FORCE MICROSCOPY;

FERROELECTRIC MATERIALS;

EID: 0031698953     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)