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Volumn 145, Issue 1, 1998, Pages 70-76

Method of critical distances for stochastic assessment of voltage sags

Author keywords

Critical distance; Phase to phase faults; Single phase faults; Stochastic assessment; Voltage sags

Indexed keywords

CALCULATIONS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; ELECTRIC FAULT CURRENTS; ELECTRIC IMPEDANCE; ELECTRIC LOADS; FAILURE ANALYSIS; OVERHEAD LINES;

EID: 0031698805     PISSN: 13502360     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-gtd:19981739     Document Type: Article
Times cited : (86)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.