Two-dimensional dusters in SiGe/Si heterostructures and their effect on field effect transistor transport characteristics

Superlattices and Microstructures

Volumn 23, Issue 2, 1998, Pages 407-411

  Girginoudi, D ^a   Thanailakis, A ^a   Georgoulas, N ^a   Kasabyan, V ^b   Christou, A ^b  

^a DEMOCRITUS UNIVERSITY OF THRACE   (Greece)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Clusters; Scattering; Silicon germanium

Indexed keywords

CRYSTAL ORIENTATION; DEPOSITION; ELECTROMAGNETIC WAVE SCATTERING; EXCIMER LASERS; HIGH ELECTRON MOBILITY TRANSISTORS; MONTE CARLO METHODS; PHOTOLUMINESCENCE; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR GROWTH; SUBSTRATES; TRANSCONDUCTANCE;

ALLOY CLUSTERING;

HETEROJUNCTIONS;

EID: 0031698643     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.1996.0350     Document Type: Article

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