Electronic properties of C60 thin films

Fullerene Science and Technology

Volumn 6, Issue 1, 1998, Pages 113-124

  Mishori, B ^a   Katz, E A ^b   Faiman, D ^b   Belu Manan, A ^c   Shapira, Yoram ^a  

^a TEL AVIV UNIVERSITY   (Israel)

^b BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^c NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; ENERGY GAP; FULLERENES; HIGH TEMPERATURE EFFECTS; PHOTOCONDUCTIVITY; POLYCRYSTALLINE MATERIALS; SPECTROSCOPIC ANALYSIS;

SURFACE PHOTOVOLTAGE SPECTROSCOPY (SPS);

SEMICONDUCTING FILMS;

EID: 0031683833     PISSN: 1064122X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10641229809350188     Document Type: Article

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