Fast clamped short circuit protection of IGBTs

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Volumn 2, Issue , 1998, Pages 724-730

  John, Vinod ^a   Suh, Bum Seok ^a   Lipo, Thomas A ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LOSSES; GATES (TRANSISTOR); SEMICONDUCTOR DEVICE MANUFACTURE; SHORT CIRCUIT CURRENTS;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

BIPOLAR TRANSISTORS;

EID: 0031683805     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)