Pattern matching algorithm for verification and analysis of very large IC layouts

Proceedings of the International Symposium on Physical Design

Volumn , Issue , 1998, Pages 129-134

  Niewczas, Mariusz ^a   Maly, Wojciech ^a   Strojwas, Andrzej ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; DATA REDUCTION; DATABASE SYSTEMS;

PATTERN MATCHING ALGORITHMS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0031683753     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)