Perpendicularly magnetized Fe-Pt (0 0 1) thin films with (B · H)max exceeding 30 MG Oe

Journal of Magnetism and Magnetic Materials

Volumn 177-181, Issue PART 2, 1998, Pages 1231-1232

  Watanabe, M ^a   Homma, M ^b   Masumoto, T ^a  

^a Research Institute of Electric and Magnetic Alloys Sendai   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Anisotropy magnetocrystalline; Atomic force microscopy; Coercivity; Energy product; Thin films sputtered

Indexed keywords

ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; COMPOSITION; FILM PREPARATION; MAGNETIC ANISOTROPY; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; MAGNETOMETERS; MORPHOLOGY; SPUTTERING; X RAY SPECTROSCOPY;

ALTERNATING GRADIENT FORCE MAGNETOMETER; ENERGY DISPERSIVE X RAY SPECTROSCOPY; EQUIATOMIC COMPOSITION; GROOVED MORPHOLOGY; INDUCTIVELY COUPLED ARGON PLASMA SPECTROSCOPY; MAGNETOCRYSTALLINE ANISOTROPY;

MAGNETIC FILMS;

EID: 0031683358     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(97)00828-7     Document Type: Article

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