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Surface Science

Volumn 396, Issue 1-3, 1998, Pages 176-188

Growth of Al2O3 stripes in NiA(001)

(3) Blum, Ralf Peter a Ahlbehrendt, Dirk a Niehus, Horst a

a HUMBOLDT UNIVERSITY (Germany)

Author keywords

Aluminum; Aluminum oxide; Scanning tunneling microscopy; Surface relaxation and reconstruction

Indexed keywords

ALUMINA; ANISOTROPY; ANNEALING; CATALYSIS; FILM GROWTH; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; NICKEL COMPOUNDS; OXIDATION; SCANNING TUNNELING MICROSCOPY; ULTRATHIN FILMS;

ION SCATTERING SPECTROSCOPY; SPOT PROFILE ANALYSIS; SURFACE RECONSTRUCTION;

SURFACE STRUCTURE;

EID: 0031681055 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(97)00667-5 Document Type: Article

Times cited : (82)

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