Accurate solutions for sub-micron metal-clad optical fibers for optical scanning microscopes

Nondestructive Testing and Evaluation

Volumn 14, Issue 3, 1998, Pages 105-114

  Themistos, C ^a   Rahman, B M A ^a   Grattan, K T V ^a  

^a CITY UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; METAL CLADDING; OPTICAL FIBERS; PERTURBATION TECHNIQUES; SCANNING;

NEAR FIELD OPTICAL SCANNING MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0031681016     PISSN: 10589759     EISSN: None     Source Type: Journal    
DOI: 10.1080/10589759808953045     Document Type: Article

References (9)