High-resolution current and temperature mapping of electronic devices using scanning Joule expansion microscopy

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1998, Pages 169-172

  Varesi, J ^a   Muenster, S ^a   Majumdar, A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT DISTRIBUTION MEASUREMENT; ELECTRONIC EQUIPMENT; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT; THERMAL EXPANSION;

JOULE HEATING; SCANNING JOULE EXPANSION MICROSCOPY (SJEM);

ATOMIC FORCE MICROSCOPY;

EID: 0031680441     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1998.670507     Document Type: Conference Paper

References (13)