A new approach to translational laminographic method for PCB inspection

Circuit World

Volumn 24, Issue 2, 1998, Pages 14-20

  An, Jinung ^a   Cho, Young Bin ^a   Gweon, Dae Gab ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; IMAGE PROCESSING; IMAGING SYSTEMS; IMAGING TECHNIQUES; INSPECTION; RECURSIVE FUNCTIONS; X RAY APPARATUS;

TRANSLATIONAL LAMINOGRAPHY SYSTEMS; X RAY IMAGING SYSTEMS;

PRINTED CIRCUIT BOARDS;

EID: 0031679758     PISSN: 03056120     EISSN: None     Source Type: Journal    
DOI: 10.1108/03056129810368332     Document Type: Article

References (5)

1. An J., Cho, Y.-B. and Gweon, D.-G. (1997), "Overlapped X-ray image separation via object translation", in Proceedings of the Technical Program, NEPCON WEST97, pp. 86-95.
2. Baker, B.D., Corey, R.L., Adams, J.A. and Ross, E.W. (1990), "Automated laminography system for inspection of electronics", US Pat. No. 4 926 452.
3. Ewert, U., Robbel, J., Bellon, C., Schumm, A. and Nockemann, C. (1995), "Digital laminography", Materialpruefung, Vol.37 No.6, pp. 218-22.
4. Knoll, G.F. (1979), Radiation Detection and Measurement, John Wiley and Sons, pp. 18-59.
5. Rooks, S.M. Benhabib, B. and Smith, K.C. (1995), "Development of an inspection process for ball-grid-array technology using scanned-beam X-ray laminography", IEEE Transactions on Components, Packaging and Manufacturing Technology-Part A, Vol.18 No.4, pp.851-61.