Microstructural evolution during creep of single-phase gamma TiAl

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 29, Issue 1, 1998, Pages 99-104

  Lu, Min ^a,b   Hemker, K J ^c  

^a JOHNS HOPKINS UNIVERSITY   (United States)

^b Precision Castparts Corporation   (United States)

^c Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CREEP TESTING; CRYSTAL MICROSTRUCTURE; DENSITY MEASUREMENT (SPECIFIC GRAVITY); DISLOCATIONS (CRYSTALS); STRESS ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

TITANIUM ALUMINIDE;

TITANIUM ALLOYS;

EID: 0031678883     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-998-0162-6     Document Type: Article

References (25)

1. Y.W. Kim and D.M. Dimiduk: JOM, 1991, vol. 43 (8), p. 40.
2. Y.W. Kim: JOM, 1995, vol. 47 (7), p. 38.
3. Y.W. Kim: JOM, 1994, vol. 46 (7), p. 30.
4. J. Beddoes, W. Wallace, and L. Zhao: Int. Mater. Rev., 1995, vol. 40 (5), p. 197.
5. R.W. Hayes and P.L. Martin: Proc. 5th Int. Conf. on Creep and Fracture of Engineering Materials and Structures, Swansea, Mar. 1993, The Institute of Materials, London, 1993, p. 285.
6. R.W. Hayes and P.L. Martin: Acta Metall. Mater., 1995, vol. 43, p. 2761.
7. T. Takahashi, H. Nagai, and H. Oikawa: Mater. Trans., JIM, 1989, vol. 30, p. 1044.
8. T. Takahashi, H. Nagai, and H. Oikawa: Mater. Sei. Eng., 1989, vol. Al 14, p. 13.
9. T. Takahashi and H. Oikawa: Mater. Res. Soc. Symp. Proc., 1989, vol. 133, p. 699.
10. Y. Ishikawa, K. Maruyama, and H. Oikawa: in Structural Intermetallics, R. Darolia, J.J. Lewandowski, C.T. Liu, P.L. Martin, D.B. Miracle, and M.V. Nathal, eds., TMS, Warrendale, PA, 1993, p. 345.
11. J. Wolfenstine and G. Gonzalez-Doncel: Mater. Lett., 1994, vol. 18, p. 286.
12. H. Nagai, T. Takahashi, and H. Oikawa: J. Mater. Sei., 1990, vol. 25, p. 629.
13. T. Takahashi, H. Nagai, and H. Oikawa: Mater. Sei. Eng., 1990, vol. A128, p. 195.
14. Y. Ishikawa, K. Maruyama, and H. Oikawa: Mater. Trans., JIM, 1990, vol. 33, p. 1182.
15. M. Lu and K.J. Hemker: Acta Mater., 1997, vol. 45, No. 9, pp. 357385.
16. Y. Ishikawa and H. Oikawa: Mater. Trans., JIM, 1994, vol. 35, p. 336.
17. B. Viguier, K.J. Hemker, J. Bonneville, F. Louchet, and J.-L. Martin: Phil. Mag. A, 1995, vol. 71A, p. 1295.
18. J.E. Bailey and P.B. Hirsch: Phil. Mag. Ser. 8, 1960, vol. 5, p. 485.
19. A.K. Head, P. Humble, L.M. Clarebrough, A.J. Morton, and C.T. Forwood: Computed Electron Micrographs and Defect Identification, North-Holland Publishing Company, Amsterdam, 1973.
20. G. Hug, A. Loiseau, and A. Lasalmonie: Phil. Mag. A, 1986, vol. 54A, p. 47.
21. B. Viguier and K.J. Hemker: Phil. Mag. A, 1996, vol. 73A, p. 575.
22. S. Wardle, I. Phan, and G. Hug: Phil. Mag. A, 1993, vol. 68A, p. 471.
23. M.A. Morris: Phil. Mag. A, 1994, vol. 69A, p. 129.
24. W.G. Johnston and J.J. Gilman: J. Appl. Phys., 1959, vol. 30, p. 129.
25. E. Orowan: Proc. Phys. Soc., 1940, vol. 52, p. 8.