Structure of the inhibition layer after hot dip galvanizing of Ti IF-DDQ, TiNb IF-DDQ and TiNb+P IF-HSS substrates

TMS Annual Meeting

Volumn , Issue , 1998, Pages 13-25

  Hertveldt, I ^a   Craenen, J ^a   Dilewijns, J ^a   Blanpain, B ^a   Xhoffer, C ^a   De Cooman, B C ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL STRUCTURE; GALVANIZING; INTERFACES (MATERIALS); MORPHOLOGY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THERMAL EFFECTS; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

HOT DIP GALVANIZING; INHIBITION LAYERS;

PROTECTIVE COATINGS;

EID: 0031678310     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)