ASIC library granular DRAM macro with built-in self test

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 1998, Pages 74-75,-416

  Dreibelbis, Jeffrey ^a   Barth Jr , John ^a   Kho, Rex ^a   Kalter, Howard ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER ARCHITECTURE; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; LOGIC CIRCUITS;

BUILT IN SELF TESTS; DYNAMIC RANDOM ACCESS MEMORY (DRAM);

RANDOM ACCESS STORAGE;

EID: 0031678265     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)