Temperature dependence of the phototransport properties in C60 films

Fullerene Science and Technology

Volumn 6, Issue 1, 1998, Pages 39-57

  Balberg, I ^a   Naides, R ^a   San, G ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL LATTICES; ELECTRONIC STRUCTURE; ENERGY GAP; FULLERENES; MATHEMATICAL MODELS; OXYGEN; PHASE TRANSITIONS; PHOTOCONDUCTIVITY; THERMAL EFFECTS; TRANSPORT PROPERTIES;

PHOTOTRANSPORT PROPERTIES;

SEMICONDUCTING FILMS;

EID: 0031677759     PISSN: 1064122X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10641229809350184     Document Type: Article

References (65)

1. 60 solids see, H.R. Krishnamurthy and A.K. Sood, Reviews of Solid State Science 5, 587 (1991).
2. For a recent collection of papers, see Novel Forms of Carbon II, edited by C.L. Renschler, D.M. Cox, J.J. Pouch, and Y. Achiba, Materials Research Society, Pittsburgh, Vol. 349 1994.
3. Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, K.M. Kadish and S. Rouff, Eds. (The Electrochemical Soc., Pennington, 1994).
4. See, for example, N. Takahashi et al., J. Appl. Phys. 74 5790 (1993), M.C. Valsakumar et al., Phys. Rev. B 48, 9080 (1993).
5. See, for example, N. Takahashi et al., J. Appl. Phys. 74 5790 (1993), M.C. Valsakumar et al., Phys. Rev. B 48, 9080 (1993).
6. C.G.B. Garett in Semiconductors, N.B. Hanney, ed. (Reinhold, New York, 1960), chap. 15.
7. A.F. Hebard et al., Nature 350, 600 (1991).
8. See, for example, R.A. Sachidanandam and A.B. Harris, Phys. Rev. Lett. 67, 1467 (1991), R.W. Lof et al., Phys. Rev. Lett. 68, 3924 (1992), C. Hartmann et al., Phys. Rev. B 52, R5550 (1995), C.H. Lee et al., Phys. Rev. B 48, 8506 (1993), B. Mishori et al., Chem. Phys. Letters, in press.
9. See, for example, R.A. Sachidanandam and A.B. Harris, Phys. Rev. Lett. 67, 1467 (1991), R.W. Lof et al., Phys. Rev. Lett. 68, 3924 (1992), C. Hartmann et al., Phys. Rev. B 52, R5550 (1995), C.H. Lee et al., Phys. Rev. B 48, 8506 (1993), B. Mishori et al., Chem. Phys. Letters, in press.
10. See, for example, R.A. Sachidanandam and A.B. Harris, Phys. Rev. Lett. 67, 1467 (1991), R.W. Lof et al., Phys. Rev. Lett. 68, 3924 (1992), C. Hartmann et al., Phys. Rev. B 52, R5550 (1995), C.H. Lee et al., Phys. Rev. B 48, 8506 (1993), B. Mishori et al., Chem. Phys. Letters, in press.
11. See, for example, R.A. Sachidanandam and A.B. Harris, Phys. Rev. Lett. 67, 1467 (1991), R.W. Lof et al., Phys. Rev. Lett. 68, 3924 (1992), C. Hartmann et al., Phys. Rev. B 52, R5550 (1995), C.H. Lee et al., Phys. Rev. B 48, 8506 (1993), B. Mishori et al., Chem. Phys. Letters, in press.
12. See, for example, R.A. Sachidanandam and A.B. Harris, Phys. Rev. Lett. 67, 1467 (1991), R.W. Lof et al., Phys. Rev. Lett. 68, 3924 (1992), C. Hartmann et al., Phys. Rev. B 52, R5550 (1995), C.H. Lee et al., Phys. Rev. B 48, 8506 (1993), B. Mishori et al., Chem. Phys. Letters, in press.
13. J.P. Lu, X.-P. Li, and R.M. Martin, Phys. Rev. lett. 68, 1551 (1992).
14. H. Yonehara and C. Pac, Appl. Phys. Lett. 61, 575 (1992).
15. K. Pichler et al., Synth. Metals 51, 257 (1992).
16. N.S. Sariciftci et al., Appl. Phys. Lett. 62, 585 (1993), N.S. Sariciftci and A.J. Heeger, Int. J. Mod. Phys. B 8, 237 (1994).
17. N.S. Sariciftci et al., Appl. Phys. Lett. 62, 585 (1993), N.S. Sariciftci and A.J. Heeger, Int. J. Mod. Phys. B 8, 237 (1994).
18. J. Mort et al., Appl. Phys. Lett. 61, 1829 (1992).
19. R. Konenkamp, R. Engelhardt and R. Henninger, Solid State Commun. 97, 285 (1996).
20. H. Yamaguchi et al., J. Phys. Soc. Jap. 64, 527 (1995).
21. M. Patrini et al., in Ref. 2, p. 632.
22. R. Konenkamp, J. Erxmeyer, and A. Weidinger, Appl. Phys. Lett. 65, 758 (1994).
23. V. Capozzi et al., Solid State Commun. 98, 853 (1996).
24. K. Pichler et al., J. Phys. Condensed Matter 3, 9259 (1991).
25. H. Yamaguchi and T. Masumi, J. Phys. Soc. Jap. 61, 4279 (1992).
26. H.J. Byrne et al., Appl. Phys. A 57, 81 (1993).
27. A. Hamed, R. Escalante, and P.H. Hor, Phys. Rev. B 50, 8050 (1994).
28. C. H. Lee et al., Phys. Rev. B 49, 10572 (1994) and C.H. Lee et al., Mol. Cryst. Liq. Cryst. 256 769 (1994).
29. C. H. Lee et al., Phys. Rev. B 49, 10572 (1994) and C.H. Lee et al., Mol. Cryst. Liq. Cryst. 256 769 (1994).
30. I. Rusakova, A. Hamed, and P.H. Hor in Ref. 2, p. 101.
31. T. Arai et al., Solid State Commun. 84, 827 (1992).
32. S. Gonda et al., in Ref. 2, p. 325.
33. S. Kazaoui, R. Ross, and N. Minami, Solid State Commun. 90, 623 (1994).
34. J. Mort et al., Appl. Phys. Lett. 60, 1735 (1992).
35. M. Kaiser et al., Solid State Commun. 81 261 (1992), ibid, 87, 281 (1993), and H.J. Byrne et al., Appl. Phys. A 57, 303 (1993).
36. M. Kaiser et al., Solid State Commun. 81 261 (1992), ibid, 87, 281 (1993), and H.J. Byrne et al., Appl. Phys. A 57, 303 (1993).
37. M. Kaiser et al., Solid State Commun. 81 261 (1992), ibid, 87, 281 (1993), and H.J. Byrne et al., Appl. Phys. A 57, 303 (1993).
38. M. Hosoya et al., Phys. Rev. B 49, 4981 (1994).
39. D. Mendoza and R. Escudero, Solid State Commun. 100 507 (1996).
40. R.H. Bube, Photoelectronic Properties of Semiconductors (Cambridge University, Cambridge, 1992).
41. Y. Lubianiker et al., Mater. Res. Soc. Proc. of Symp. A, 1996, in press.
42. I. Balberg, J. Appl. Phys. 75, 914 (1994).
43. I. Balberg and Y. Lubianiker, Phys. Rev. B 48, 8709 (1993).
44. M. Saint-Paul et al., Solid State Phys. 83 799 (1992).
45. M. Manciu et al., Fullerene Sci. Technol. 2, 255 (1994).
46. The authors are indebted to Dr. E. Katz for these x-ray measurements and for the crystal used for the transport and phototransport measurements. This crystal was grown using the method of R.L. Meng et al., Appl. Phys. Lett. 59, 3402 (1991).
47. J. Mort et al., Phil. Mag. Lett. 67, 77 (1993).
48. A.V. Bazhenov et al., in Ref. 2, p. 1711.
49. D. Faiman et al., Thin Solid Films, 1996, in press.
50. E. Frankevich et al. Solid State Commun. 88, 177 (1993).
51. F. Vaillant and D. Jousse, Phys. Rev. B 34, 4088 (1986).
52. D. Sarker and H.J. Halas, Solid State Commun. 90, 261 (1994).
53. A. Zahab and L. Firlej, Sol. State Commun. 87, 893 (1993), J. Gong et al., Thin Solid Films, 261, 266 (1995).
54. A. Zahab and L. Firlej, Sol. State Commun. 87, 893 (1993), J. Gong et al., Thin Solid Films, 261, 266 (1995).
55. W. Guss et al., Phys. Rev. Lett. 72, 2644 (1994).
56. For a review, see, I. Balberg, in Journal de Physique, Collque. Supp. 6 41, C5 (1980), S. Alexander, J.S. Hellman and I. Balberg, Phys. Rev. B 13, 304 (1976), I. Balberg and A. Maman, Phys. Rev. B 16, 4535 (1977).
57. For a review, see, I. Balberg, in Journal de Physique, Collque. Supp. 6 41, C5 (1980), S. Alexander, J.S. Hellman and I. Balberg, Phys. Rev. B 13, 304 (1976), I. Balberg and A. Maman, Phys. Rev. B 16, 4535 (1977).
58. For a review, see, I. Balberg, in Journal de Physique, Collque. Supp. 6 41, C5 (1980), S. Alexander, J.S. Hellman and I. Balberg, Phys. Rev. B 13, 304 (1976), I. Balberg and A. Maman, Phys. Rev. B 16, 4535 (1977).
59. M.P. Gefand and J.P. Lu, Phys. Rev. Lett. 68, 1050 (1992), B. Gu et al., Ref. 2, p. 289.
60. M.P. Gefand and J.P. Lu, Phys. Rev. Lett. 68, 1050 (1992), B. Gu et al., Ref. 2, p. 289.
61. A. Hamed et al., Phys. Rev. B 50, 11219 (1994).
62. M.K. Nissen, S.M. Wilson and M.L.W. Thewalt, Phys. Rev. Lett. 69 2423 (1992).
63. J.P. Lu et al., Phys. Rev. Lett. 68, 1551 (1992).
64. P.A. Heiney et al., Phys. Rev. Lett. 66 2911 (1991), and W.I.F. David, Europhys. Lett. 18, 219 (1992).
65. P.A. Heiney et al., Phys. Rev. Lett. 66 2911 (1991), and W.I.F. David, Europhys. Lett. 18, 219 (1992).